Produkty od výrobce Micro to Nano1
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JEOL ᴓ32 x 10mm cylinder SEM stub, Al, 10 ks/bal
EM-Tec 8W.AM precision wafer handling tweezers for ᴓ8 inch/200mm, anti-magnetic stainless steel
Micro-Tec PS9 probe set with PV1 probe holder and TA5 angled ultra-fine tungsten needle probe
EM-Tec RXS-TaSi resolution contrast test standard, fused Ta/Si on pin stub
EM-Tec FV50 tall brass SEM stage adapter pillar only, for FEI with M4 screw, 50mm x M6F, 1 ks/bal
EM-Tec F13 filter disc holder for filter ᴓ 13mm, ᴓ14mm JEOL stub, 1 ks/bal
EM-Tec Formvar Carbon support film on 100 square mesh grid, Cu, 100 ks/bal
Krytox GPL205 PFPE/PTFE grease, 57 gr
Value-Tec 93303.CP ESD safe plastic tweezers, flat, rounded tips
Tungsten rod source, 102mm long, 8 layers of tungsten wire, 5 ks/bal
PTFE kádinka 50 ml
EM-Tec Formvar Carbon support film on 100 square mesh grid, Au, 100 ks/bal
Tin Sputter Target, Ø28 x 0.20mm Disc, 99.99% Sn
Nano-Tec silver coated silicon wafer Ø3inch/76mm, 381µm thickness, 500nm Ag, 5 ks/bal
JEOL ᴓ32 x 20mm cylinder SEM stub, Al, 10 ks/bal
ᴓ32mm x 5mm spacer discs for EM-Tec reference holder, 10ks/bal
Micro-Tec PS8 probe set with PV1 probe holder and T5 straight ultra-fine tungsten needle probe
EM-Tec B100 Faraday cup for beam current measurements
FEI F22 SEM stage adapter base, 20mm x M6F, aluminium,1 ks/bal
EM-Tec F25 filter disc holder for filter ᴓ 25mm, ᴓ14mm JEOL stub, 1 ks/bal
EM-Tec Formvar Carbon support film on 100 square mesh grid, Au, 25 ks/bal
Value-Tec 93305.CP ESD safe plastic tweezers, flat, wide tips
Tungsten rod source, 127mm long, 8 layers of tungsten wire, 5 ks/bal
PTFE kádinka 350 ml
EM-Tec Formvar support film on 150 square mesh grid, Cu, 25 ks/bal
Tantalum Sputter Target, Ø28x 0.5mm Disc, 99.99% Ta
Nano-Tec silver coated silicon wafer Ø4inch/100mm, 525µm thickness, 50nm Ag, 3 ks/bal
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