Pro test rozlišení (Resolution test specimens)
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S1967T Tin on Carbon Test Specimen, Tin spheres dia.10-100 nm on thin (0,5mm) carbon disc ᴓ 6mm
EM-Tec Au on C resolution standard 1, 5-200nm, mounted on Ø12.2mm JEOL stub
S1967U Tin on Carbon Test Specimen, Tin spheres dia.10-100 nm on C disc t=2mm, ᴓ 6mm
EM-Tec Au on C resolution standard 1, 5-200nm, mounted on Ø15mm Hitachi stub
S145 SEM medium resolution and grey level test specimen (Al-W dendrites)
S1988 Low kV Sn-C test specimen on 12,5mm pin-stub, l=8mm
EM-Tec Au on C resolution standard 2, 30-300nm, unmounted
S1988E Low kV Sn-C test specimen on 12,5mm JEOL stub
EM-Tec Au on C resolution standard 2, 30-300nm, mounted on Ø12.7mm pin stub
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