Příslušenství FIB (FIB accessories)
Nejprodávanějí v kategorii
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160-54 Lift-out grid storage box for 4 grids
J430A Lift-out grid storage box, antistatic
EM-Tec 4 posts lift-out grid, Cu, 100 ks/bal
EM-Tec 2 posts lift-out grid, Cu, 100 ks/bal
EM-Tec 3 posts lift-out grid, Cu, 100 ks/bal
EM-Tec Low profile double pre-tilt (52°/38°) SEM pin stub, dia.12,7mm, for FEI/TFS Dualbeam, Al
EM-Tec 5 posts lift-out grid, Cu, 100 ks/bal
EM-Tec Low profile double pre-tilt (55°/35°) SEM pin stub, dia.12,7mm, for Tescan FIBxSEM, Al
EM-Tec 2 posts lift-out grid, Mo, 25 ks/bal
EM-Tec 3 posts lift-out grid, Mo, 25 ks/bal
EM-Tec FIB lift-out grids, Mo, 4 posts, 25 ks/bal
EM-Tec H73 EBSD 70° pre-tilt sample holder for geological slides up to 48 x 28mm, M4, 1 ks
EM-Tec P73 EBSD 70° pre-tilt sample holder for geological slides up to 48 x 28mm, pin-type, 1 ks
EM-Tec P70 EBSD 70°/20° pre-tilt sample holder for pin stubs/holders, dia.12,7mm x 20mm, pin type, 1 ks
EM-Tec F12 compact FIB Lift-Out-Grid-Holder for max. 2 grids, pin type
EM-Tec P70M EBSD 70°/20° pre-tilt sample holder for Hitachi M4 stubs/holders, 12,5mm x 12,5mm x 20mm, pin, 1 ks
EM-Tec F25 FIB Grid Holder for up to 5 grids, pin type
EM-Tec H70P EBSD 70° pre-tilt sample holder for pin stubs/holders, dia.12,7mm x 20mm, M4 type, 1 ks
EM-Tec FS21 FIB Grid and sample holder for up to 2 grids and 2 pin-stubs, pin type
EM-Tec FS22 FIB grid and sample holder for up to 2x2 FIB grids and 2x dia.12,7mm pin-stubs, pin type
EM-Tec FS25 FIB grid and sample holder for up to 5 FIB grids and 1x dia.25,4mm pin-stubs, pin type
EM-Tec F25 FIB grid- holder for up to 5 grids, M4 thread
EM-Tec FS21 FIB grid and sample holder for up to 2 grids and 2 pin-stubs, M4 thread type
EM-Tec FS22 FIB grid and sample holder for up to 2x2 FIB grids and 2 pin-stubs, M4 thread type
EM-Tec FS25 FIB grid and sample holder for up to 5 FIB grids and 1x dia.25,4mm pin-stubs, M4 thread type
EM-Tec P36 fixed 36° pre-tilt sample holder for Zeiss FIB system, dia.12,7mm x 17mm, pin type, 1 ks
EM-Tec P38 fixed 38° pre-tilt sample holder for FEI Dual Beam FIB system, dia.12,7mm x 17mm, pin type, 1 ks
J411-N All-tungsten probe tips for AutoProbe™ 100 & 200 Systems, 10 ks/bal
EM-Tec P35 fixed 35° pre-tilt sample holder for Tescan FIB system, dia.12,7mm x 17mm, pin type, 1 ks
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