Pro kalibraci zvětšení (Magnification calibration samples)
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S2005 PLANOTEC Si test specimen, 5um grid (x/y), unmounted
S2006 PLANOTEC Si test specimen, 5um grid (x/y), mounted on G301 pin stub
S2006F PLANOTEC Si test specimen, 5um grid (x/y), mounted on G301F pin stub (pin l=6mm)
S2007 PLANOTEC Si test specimen, 5um grid (x/y), mounted on Hitachi stub (15mm x 6mm)
S2008 PLANOTEC Si test specimen, 5um grid (x/y), mounted on JEOL stub (10mm x 10mm)
Micro-Tec MTC-5F Multiple target calibration standard with 4 patterns, unmounted
Micro-Tec MTC-5F Multiple target calibration standard with 4 patterns, mounted on 25,4mm pin stub
Micro-Tec MTC-5F Multiple target calibration standard with 4 patterns, mounted on 25mm JEOL stub
Micro-Tec MTC-5F Multiple target calibration standard with 4 patterns, mounted on 25mm Hitachi stub
Micro-Tec MTC-5F Multiple target calibration standard with 4 patterns, mounted on black microscopy slide
Micro-Tec MTCD-5 Dark field multiple target calibration standard with 4 patterns, unmounted
Micro-Tec MTCD-5 Dark field multiple target calibration standard with 4 patterns, mounted on 25,4mm pin stub
Micro-Tec MTCD-5 Dark field multiple target calibration standard with 4 patterns, mounted on 25mm JEOL stub
Micro-Tec MTCD-5 Dark field multiple target calibration standard with 4 patterns, mounted on 25mm Hitachi stub
643-1 SEM titanium test object, 292 nm (nominal) for high magnification, high resolution, uncertified
643-11 292nm High Resolution AFM Reference Standard, Unmounted, Certified
EM-Tec MCS-1TR traceable calibration standard 2,5mm to 1um, unmounted
EM-Tec MCS-1TR traceable calibration standard 2,5mm to 1um, mounted on std pin stub 12,7mm dia
EM-Tec MCS-1TR traceable calibration standard 2,5mm to 1um, mounted on Zeiss pin stub 12,7mm dia
EM-Tec MCS-1TR traceable calibration standard 2,5mm to 1um, mounted on JEOL stub 12,2mm dia
EM-Tec MCS-1TR traceable calibration standard 2,5mm to 1um, mounted on 15mm Hitachi stub
EM-Tec MCS-1TR traceable calibration standard 2,5mm to 1um, mounted on custom stub
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, unmounted
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, mounted on std pin stub 12,7mm dia
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, mounted on Zeiss pin stub 12,7mm dia
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, mounted on 12,2mm JEOL stub
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, mounted on 15mm Hitachi stub
EM-Tec MCS-1CF certified calibration standard 2,5mm to 1um, mounted on custom stub
EM-Tec MCS-0.1TR traceable calibration standard 2,5mm to 100nm, unmounted
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